Line Scan Lens UN-ALS6316K

For high-resolution web inspection, semiconductor wafer inspection, print inspection, etc.

· Developed for 86mm big frame sensor
· Low distortion
· Lens for 16K line scan camera
· Excellent optical performance, uniform imaging of center and edge

Product information: Custom designs are available upon request.

For high-end PCB AOI inspection, Mini/Micro LED panel micro-defect detection, photovoltaic silicon wafer EL hidden crack inspection, narrow precision metal strip flaw detection, luxury printing anti-counterfeit texture inspection, electronic ceramic substrate microscopic inspection and high-precision linear dimension measurement of tiny electronic components.

· Developed for 66mm big frame sensor
· Low distortion
· Compatible for 16K line scan camera
· Excellent optical performance, uniform imaging of center and edge

Product information: Custom designs are available upon request.

For high-end PCB AOI micro-inspection, Mini/Micro LED panel pixel defect detection, photovoltaic silicon wafer EL hidden crack inspection, narrow high-temperature metal strip flaw detection, luxury anti-counterfeit printing texture inspection, electronic ceramic substrate microscopic testing, UAV high-precision aerial survey mapping and ultra-precise online dimensional measurement of micro electronic components.

· Developed for 82mm big frame sensor
· Low distortion
· Compatible for 16K line scan camera
· Excellent optical performance, uniform imaging of center and edge

Product information: Custom designs are available upon request.

For color sorting equipments, textile and non-woven fabric surface testing, flexible packaging & large-format printing quality checking, plastic film and paper web flaw detection, flat glass and building panel surface screening, metal strip preliminary defect inspection, lumber board sorting and agricultural material sorting.

· Developed for 30mm big frame sensor

· Excellent optical performance, uniform imaging of center and edge

Product information: Custom designs are available upon request.

For Smart Sensors & Photovoltaic Inspection

· Developed for φ28 image format
· Wavelength: 900-1700nm
· Large Aperture, up to F1.4
· Compact and lightweight design