Line Scan Lens UN-ALS1164L-16K

Match with Teledyne camera, for Banknote Inspection, Printing Inspection 

· Ultra High Resolution 
· Large Format Lens

For high-resolution web inspection, semiconductor wafer inspection, print inspection, etc.

· Developed for 86mm big frame sensor
· Low distortion
· Lens for 16K line scan camera
· Excellent optical performance, uniform imaging of center and edge

Product information: Custom designs are available upon request.

For high-end PCB AOI micro-inspection, Mini/Micro LED panel pixel defect detection, photovoltaic silicon wafer EL hidden crack inspection, narrow high-temperature metal strip flaw detection, luxury anti-counterfeit printing texture inspection, electronic ceramic substrate microscopic testing, UAV high-precision aerial survey mapping and ultra-precise online dimensional measurement of micro electronic components.

· Developed for 82mm big frame sensor
· Low distortion
· Compatible for 16K line scan camera
· Excellent optical performance, uniform imaging of center and edge

Product information: Custom designs are available upon request.

For Smart Sensors & Photovoltaic Inspection

· Developed for φ28 image format
· Wavelength: 900-1700nm
· Large Aperture, up to F1.4
· Compact and lightweight design

For lithium battery electrode, copper foil and ceramic separator inspection, PCB & single-layer FPC AOI detection, silicon wafer routine sorting, food packaging & label printing quality control and electronic ceramic substrate inspection.

· Covering a wide working distance range

· Lockable distance and aperture settings

Product information: Custom designs are available upon request.

For high-resolution web inspection, semiconductor wafer inspection, print inspection, etc.

· Developed for 86mm big frame sensor
· Low distortion
· Lens for 16K line scan camera
· Excellent optical performance, uniform imaging of center and edge

Product information: Custom designs are available upon request.